Automatic ultrasonic examination device, automatic

专利名称：Automatic ultrasonic examination device,

automatic ultrasonic examination methodand production method using theexamination method

发明人：Hideki Tanishiki申请号：US11884197申请日：20060209公开号：US07798002B2公开日：20100921

专利附图：

摘要：An automatic ultrasonic examination device includes an ultrasonic test

instrument, a robot arm, and a control device. The ultrasonic test instrument includes anultrasonic probe to send ultrasonic and detecting reflected waves while being in contactwith the spot-welded portion, and an ultrasonic test instrument main device connected tothe ultrasonic probe to convert the reflected wave detection signals received from theultrasonic probe into test information. The control device includes a real center locationcomputing unit to identify a real center location of the spot-welded portion withreference to pieces of test information obtained around a preset tentative centerlocation of the spot-welded portion, and a determination unit to check quality of thespot-welded portion with reference to test information obtained at the real centerlocation.

申请人：Hideki Tanishiki

地址：Osaka JP

国籍：JP

代理机构：Global IP Counselors, LLP

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