Method and apparatus for performing multi-site int

专利名称：Method and apparatus for performing

multi-site integrated circuit device testing

发明人：Dennis Harold Burke,Michael Lee

Martel,Gunvant T. Patel

申请号：US10367521申请日：20030214

公开号：US20040162682A1公开日：20040819

专利附图：

摘要：Disclosed herein is an improved method and apparatus for simultaneouslyperforming tests on several devices at the same time. An aspect of one embodiment of

the invention is an improved DMA controller that automatically selects certain pingroups, which are connected to a common data bus, to receive test data words from acommon data bus. By selecting more than one pin group at the same time, test data(such as a test data word) can be simultaneously loaded onto multiple pin cards at thesame time. By loading this data into multiple pin cards at the same time, test data can be“fanned-out” to multiple pin cards and thereby be sent to multiple device sites at thesame time. Another aspect of one embodiment of the invention utilizes DMA-basedhardware to select which pin groups should received “fanned-out” test data. Byutilizing DMA-based hardware to fan-out the test data, the software-based test

programs and patterns may be created to manipulate a single device. The test programmay select the number of sites to be tested and partition the tester resources to thosesites. The DMA-based hardware and tester software will automatically fan-out the testdata to all of the appropriate test sites.

申请人：TEXAS INSTRUMENTS INCORPORATED

更多信息请下载全文后查看