专利名称：Method and apparatus for calibrating and
certifying accuracy of a wavefront sensingdevice
发明人：Griffith E. Altmann申请号：US10013573申请日：20011211公开号：US06739721B2公开日：20040525
专利附图：
摘要：A calibration component for use in calibrating and certifying the accuracy of anophthalmic wavefront sensor comprises a monolithic, plano-convex refractive optic having
known amounts of one or more selected aberrations induced by the spherical,axisymmetric aspherical, or non-axisyrmmetric aspherical convex surface. An alignmenttool is described, along with a procedure for calibrating an aberrometer.
申请人：BAUSCH AND LOMB, INC
代理人：Craig E. Larson
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