专利名称：Test probe
发明人：Bozzer, Dieter,Lanfranconi,
Guiseppe,Heutschi, Sigfrido,Scheggia, Mattia
申请号：EP08018642.2申请日：20081024公开号：EP2180326A1公开日：20100428
专利附图：
摘要：The invention relates to a test probe (1) for mating with a connector (30) in aprobe insertion direction (I), comprising a housing (2), an outer contact portion (8), theouter contact portion (8) supported by the housing (2) and extending away from the
housing (2), said outer contact portion (8) supported by an elastically deformable outerbiasing means (21) and being adapted to be deflected substantially perpendicular to theprobe insertion direction (I) and at least one contact assurance means (19), said contactassurance means (19) connecting the outer contact portion (8) electrically conductively tothe housing (2). To decrease the number of parts the contact assurance means (19) has atleast one contact section (19c), said contact section (19c) pressed conductively againstthe housing (2) by being elastically deflected.
申请人：Tyco Electronics Services GmbH
地址：Rheinstrasse 20 8200 Schaffhausen CH
国籍：CH
代理机构：Heinz-Schäfer, Marion
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