Spatial wavefront analysis and 3D measurement

专利名称：Spatial wavefront analysis and 3D

measurement

发明人：Yoel Arieli,Shay Wolfling,David Banitt,Yosi

Weitzman,Yoram Saban,EmmanuelLanzmann,Shay Levavi

申请号：US10499758申请日：20021016公开号：US07609388B2公开日：20091027

专利附图：

摘要：A method of wavefront () analysis including applying a transform to the

wavefront, applying a plurality of different phase changes () to the transformedwavefront (), obtaining a plurality of intensity maps () wherein the plurality of differentphase changes are applied to region of the transformed wavefront, corresponding to ashape of the light source.

申请人：Yoel Arieli,Shay Wolfling,David Banitt,Yosi Weitzman,Yoram Saban,EmmanuelLanzmann,Shay Levavi

地址：Jerusalem IL,Kfar-Azar IL,Tal-Shahar IL,Tel Aviv IL,Shoham IL,Tel Aviv IL,Haifa IL

国籍：IL,IL,IL,IL,IL,IL,IL

代理机构：Darby & Darby P.C.

更多信息请下载全文后查看