Phase locked loop calibration

专利名称：Phase locked loop calibration发明人：Hea Joung Kim,Brima B. Ibrahim申请号：US107424申请日：20031219公开号：US07095992B2公开日：20060822

专利附图：

摘要：A method for calibrating a phase locked loop (PLL) includes an open loop testand a closed loop test. The open loop test includes providing an optimal control input toa controlled oscillator (CO) of the PLL; determining rate of output oscillation of the CObased on the optimal control input; comparing the rate of the output oscillation with rate

of an optimal output oscillation; and when the comparing the rate of the outputoscillation with rate of the optimal output oscillation is unfavorable, adjusting anoscillation point of the CO until the comparing is favorable to produce an open-loopadjusted CO oscillation point. The close loop test includes determining a closed-loopinput control level of the CO at the open-loop adjusted CO oscillation point; comparingthe closed-loop input control level with the optimal control input; and when thecomparing the closed-loop input control level with the optimal control input is notfavorable, adjusting the open-loop adjusted CO oscillation point until the comparing isfavorable.

申请人：Hea Joung Kim,Brima B. Ibrahim

地址：Los Angeles CA US,Aliso Viejo CA US

国籍：US,US

代理机构：Garlick Harrison & Markison

代理人：Timothy W. Markison

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