专利名称:FIN TUNNEL FIELD EFFECT TRANSISTOR
(FET)
发明人:Krishna Bhuwalka申请号:US15478198申请日:20170403
公开号:US20170207328A1公开日:20170720
专利附图:
摘要:A fin tunnel field effect transistor includes a seed region and a first type regiondisposed above the seed region. The first type region includes a first doping. The fintunnel field effect transistor includes a second type region disposed above the first type
region. The second type region includes a second doping that is opposite the firstdoping. The fin tunnel field effect transistor includes a gate insulator disposed above thesecond type region and a gate electrode disposed above the gate insulator. A methodfor forming an example fin tunnel field effect transistor is provided.
申请人:Taiwan Semiconductor Manufacturing Company Limited
地址:Hsin-Chu TW
国籍:TW
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